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			<title>Bruker Wins Over $7 Million in SP9900+ 3D Optical Microscope Orders</title>
			<pubDate>Fri, 07 Dec 2012 03:00:00 -0500</pubDate>
			<description>Instrument Breaks the Throughput Barrier for HDI Substrate Metrology [PR.com]</description>
			<link>https://www.pr.com/press-release/459779</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Releases AFM Zoom Option for 3D Optical Microscopes</title>
			<pubDate>Sat, 01 Dec 2012 03:00:00 -0500</pubDate>
			<description>NanoLens™ Accessory Expands Power of ContourGT Systems [PR.com]</description>
			<link>https://www.pr.com/press-release/458481</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Advances Universal Mechanical Tester (UMT) Design</title>
			<pubDate>Sat, 01 Dec 2012 03:00:00 -0500</pubDate>
			<description>New UMT Increases Flexibility and Seamlessly Integrates Optical Profiling and Mechanical Testing [PR.com]</description>
			<link>https://www.pr.com/press-release/458487</link>
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			<title>PeakForce Tapping Gains Rapid Adoption as Revolutionary AFM Mode</title>
			<pubDate>Sat, 01 Dec 2012 03:00:00 -0500</pubDate>
			<description>Over 100 Research Citations in 3 Years [PR.com]</description>
			<link>https://www.pr.com/press-release/458498</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Introduces Proprietary IRIS TERS Probes</title>
			<pubDate>Sat, 01 Dec 2012 03:00:00 -0500</pubDate>
			<description>High-Contrast, Proven TERS Probe Tips for Complete Innova-IRIS TERS Solution [PR.com]</description>
			<link>https://www.pr.com/press-release/458499</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Wins Over $3 Million in Orders for Consumer Display Solution</title>
			<pubDate>Sat, 10 Nov 2012 03:00:00 -0500</pubDate>
			<description>Multi-System ContourGT-X Delivery Meets Ramping Demand [PR.com]</description>
			<link>https://www.pr.com/press-release/454156</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Releases New Benchmark 3D Optical Microscope System</title>
			<pubDate>Thu, 18 Oct 2012 03:00:00 -0400</pubDate>
			<description>Bruker&#039;s ContourGT-I is First Bench Top with Tip/Tilt Head and Vibration Tolerant Design [PR.com]</description>
			<link>https://www.pr.com/press-release/448628</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>NSG Group Selects Bruker Dimension Icon Atomic Force Microscope</title>
			<pubDate>Wed, 26 Sep 2012 03:00:00 -0400</pubDate>
			<description>New Levels of AFM Ease of Use and Productivity Accelerate Next-Generation Product Development [PR.com]</description>
			<link>https://www.pr.com/press-release/443545</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Introduces New AFM Tools for Life Science Research</title>
			<pubDate>Sat, 22 Sep 2012 03:00:00 -0400</pubDate>
			<description>*Nanomechanics Package Expands Applications in Mechanobiology [PR.com]</description>
			<link>https://www.pr.com/press-release/442524</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Semiconductor Leader Purchases Multiple Bruker 3D Optical Microscopes</title>
			<pubDate>Mon, 03 Sep 2012 03:00:00 -0400</pubDate>
			<description>*ContourGT-X Analyzes Critical Yield Issues in Copper-based Processes in Semiconductor Packaging. [PR.com]</description>
			<link>https://www.pr.com/press-release/438271</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Introduces New Nanoelectrical AFM Mode</title>
			<pubDate>Wed, 15 Aug 2012 03:00:00 -0400</pubDate>
			<description>PeakForce KPFM Enables Quantitative Nanoscale Surface Potential Measurements [PR.com]</description>
			<link>https://www.pr.com/press-release/434016</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Announces Dimension FastScan Bio AFM for Biological Dynamics</title>
			<pubDate>Fri, 03 Aug 2012 03:00:00 -0400</pubDate>
			<description>First Commercial Bio-AFM to Capture High-Resolution Dynamics with Ease [PR.com]</description>
			<link>https://www.pr.com/press-release/431681</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Announces Three Next-Generation Semiconductor Metrology Products</title>
			<pubDate>Sat, 14 Jul 2012 03:00:00 -0400</pubDate>
			<description>New AFM and X-Ray Systems Enable Industry Transition to Larger, 450mm Wafer Production [PR.com]</description>
			<link>https://www.pr.com/press-release/426928</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Introduces EC-AFM Solutions for Li Battery Research</title>
			<pubDate>Fri, 22 Jun 2012 03:00:00 -0400</pubDate>
			<description>Dimension Icon Platform Enhancement Enables In Situ Studies of Battery Electrodes [PR.com]</description>
			<link>https://www.pr.com/press-release/422030</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Introduces Novel TERS-Ready AFM System</title>
			<pubDate>Fri, 02 Dec 2011 03:00:00 -0500</pubDate>
			<description>New Bruker Innova-IRIS System Delivers Highest AFM-Raman Performance [PR.com]</description>
			<link>https://www.pr.com/press-release/373514</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Completes Acquisition of Center for Tribology, Inc.</title>
			<pubDate>Sat, 15 Oct 2011 03:00:00 -0400</pubDate>
			<description>Bruker Corporation today announced the closing of its acquisition of Center for Tribology, Inc. (CETR) for $13 million in cash as an initial purchase price, with potential additional earn-out payments of up to $4 million in cash, depending on growth and profitability of the CETR-business within Bruker in 2012 and 2013. CETR, a privately held tribology and mechanical testing company headquartered in Campbell, CA, with 30 [PR.com]</description>
			<link>https://www.pr.com/press-release/361264</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Announces Agreement to Acquire CETR</title>
			<pubDate>Fri, 16 Sep 2011 03:00:00 -0400</pubDate>
			<description>Bruker Nano Surfaces Division to Add Synergistic Tribology and Indenting Equipment Business [PR.com]</description>
			<link>https://www.pr.com/press-release/353696</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Alcon Selects Bruker ContourGT 3D Microscope for Intra-Ocular Lens R&amp;D</title>
			<pubDate>Fri, 09 Sep 2011 12:46:16 -0400</pubDate>
			<description>ContourGT-X8 Non-Contact, Optical Surface Profiler Enables Rapid, Repeatable Nanoscale-Level Characterization of Intra-Ocular Lenses. [PR.com]</description>
			<link>https://www.pr.com/press-release/350657</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker’s AcuityXR Receives R&amp;D 100 Award for Technological Innovation</title>
			<pubDate>Sat, 20 Aug 2011 03:00:00 -0400</pubDate>
			<description>Enhanced Resolution Enables ContourGT 3D Optical Microscopes to Break Diffraction Limit [PR.com]</description>
			<link>https://www.pr.com/press-release/347292</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Introduces Dimension Edge PSS Atomic Force Microscope for Advanced HB-LED Production Metrology</title>
			<pubDate>Wed, 17 Aug 2011 03:00:00 -0400</pubDate>
			<description>The Dimension Edge PSS is an easy-to-operate AFM that delivers resolution far beyond traditional optical techniques while at the same time providing precise 3D profile information to control the most advanced PSS processes. [PR.com]</description>
			<link>https://www.pr.com/press-release/346331</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Announces Fast Scanning for the MultiMode Atomic Force Microscope</title>
			<pubDate>Thu, 21 Jul 2011 03:00:00 -0400</pubDate>
			<description>Fast Scanning Technology Now Available on the MultiMode 8 AFM [PR.com]</description>
			<link>https://www.pr.com/press-release/340083</link>
			<dc:creator>Bruker Corporation</dc:creator>
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			<title>Bruker Demonstrates NPFLEX-LA at SAE 2011 World Congress</title>
			<pubDate>Thu, 14 Apr 2011 03:00:00 -0400</pubDate>
			<description>Patent-Pending, Comprehensive Surface Metrology Solution Enables Transportation Industry to Better Comply with Environmental Regulations and Reduce Warranty Costs. [PR.com]</description>
			<link>https://www.pr.com/press-release/313471</link>
			<dc:creator>Bruker Corporation</dc:creator>
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