CyberOptics Introduces 450MM Form Factor of WaferSense® Auto Vibration System to Meet Future Fab Requirements

CyberOptics Semiconductor introduces a new 450mm form factor of its AVS450 Auto Vibration System to assist engineers as they prepare for the next technology cycle, even though it may be few years down the road before fabs start using this form factor. - July 11, 2012

CyberOptics Semiconductor to Demo Final Production Version of WaferSense® Airborne Particle Sensor at Semicon Japan

CyberOptics Semiconductors ( will demonstrate the final production version of the WaferSense® Airborne Particle Sensor (APS) during Semicon Japan in booth number 5B-204. - November 29, 2011

450 mm Wireless Wafer Processing Metrology Sensors Support Next-Generation of Semiconductor Production Processes

CyberOptics Semiconductor offers a line of wireless 450 mm wafer processing metrology sensors to help chipmakers and tool manufacturers qualify next-generation semiconductor production processes. - October 12, 2011

CyberOptics Semiconductor to Discuss Solutions for Semiconductor Tool Qualification at ISMI Manufacturing Week

CyberOptics Semiconductor ( will discuss how a “Wireless Particle Counting Wafer Improves Semiconductor Tool Qualification” during ISMI Manufacturing Week 2011 to be held in Austin, TX during October 17 - 21. - October 08, 2011

CyberOptics Airborne Particle Sensor Honored at Semicon West

CyberOptics Airborne Particle Sensor Chosen as Finalist in Best of West 2011 Awards at Semicon West. - August 26, 2011

WaferSense® Vibration Sensor Helps Diffusion Furnace Team Identify Vibration Sources to Increase Wafer Yield

When a diffusion furnace team at a 200 mm fab experienced defect problems in specific stocker locations of its high volume semiconductor process, CyberOptics WaferSense® Auto Vibration Sensors helped test a theory that excessive vibrations created by stocker fans effected die yield. - July 08, 2011

CyberOptics Semiconductor to Demo WaferSense® Airborne Particle Sensor at Semicon West 2011

CyberOptics Semiconductor will demo its new WaferSense® Airborne Particle Sensor during Semicon West 2011 in Booth No. 2406. - April 08, 2011

WaferSense® Airborne Particle Sensor for Real-Time Semiconductor Equipment Diagnostics

Wafer-like airborne particle counter validates & analyze real-time wafer contamination - February 10, 2011

Press Releases 1 - 8 of 8