NexTechFAS Unveils NanoScan™ AOI Technology
The NanoScan Can Detect Defects as Small as 300 Nanometers. - June 26, 2008
NexTechFAS Invited to Present at Display Week 2008, the Annual Society for Information Display (SID) International Symposium and Exhibition
NexTech Solutions, Inc. and FAS Holdings Group, LLC, jointly doing business as “NexTechFAS”, are pleased to announce that the company has been invited to present at the SID/Cowen and Company Display Investors Conference on May 20 and 21, 2008. - May 08, 2008
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