Cleveland, OH, October 14, 2009 --(PR.com
)-- The Metrology Services organization at Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, has expanded the scope of its ISO 17025 accreditation with the American Association for Laboratory Accreditation (A2LA). Keithley’s accredited calibrations now include customer-site calibrations that involve DC voltages from 0 to 200 volts and DC currents from 0 to 1 ampere. This expanded scope now allows Keithley to offer accredited calibrations of its Model 4200-SCS Semiconductor Characterization System, which is capable of measuring and sourcing currents with femtoamp resolution.
Keithley’s metrology laboratory has been an A2LA-accredited calibration facility since 2006, when it was first accredited in accordance with the International Standard ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration Laboratories. The company’s German service center was accredited by A2LA in 2007. This accreditation assures Keithley customers that their instruments are being calibrated to the highest industry standards, so they can continue to deliver consistent, quality measurements. Routine calibrations help prevent unplanned downtime and costly quality problems.
For More Information.
For more information on Keithley’s Metrology Services organization or any of its test solutions or services, visit www.keithley.com or contact the company at:
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
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