Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results

Keithley broadcasted a free Web-based seminar titled “Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing” on Thursday, March 25, 2010.

Cleveland, OH, April 21, 2010 --(PR.com)-- Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, broadcasted a free, web-based seminar titled “Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing” on Thursday, March 25, 2010. This one-hour seminar discussed the keys to getting good C-V measurement results and helped laboratory engineers implement, troubleshoot, and verify C-V measurement systems. Topics discussed included system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V. To register for this event and future events, visit www.keithley.com/events/semconfs/webseminars.

Those participating in Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing had the opportunity to learn:

How to properly connect a C-V instrument to a probe station
Common cable correction techniques
Performance verification at the probe tips
How to identify and troubleshoot typical C-V errors
How to implement extended C-V applications, such as high voltage and quasistatic C-V

This seminar was intended for those whose job requires performing C-V measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations will also benefit from this seminar.

About the Presenter
Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing was presented by Lee Stauffer, Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group based in Cleveland, Ohio. Prior to joining Keithley, Stauffer’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

Registration Information
Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing was broadcasted on Thursday, March 25, 2010 at 15:00 CET (10:00 a.m. EDT) for the European audience and at 2:00 p.m. EDT for the North American audience. The event was free to the public, but participants had to register in advance at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast.

For More Information
For more information on Keithley or any of its test solutions, visit www.keithley.com or contact the company at:

Telephone:
800-688-9951
440-248-0400

Fax:
440-248-6168

E-mail:
publisher@keithley.com

Internet:
www.keithley.com

Address:
Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Products and company names listed are trademarks or trade names of their respective companies.

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Keithley Instruments
Ellen Modock
440-498-2746
www.keithley.com
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