Sunrise, FL, May 23, 2012 --(PR.com
)-- Sunrise Optical LLC: Zebra Optoprofiler Model X - a new improved metrology for the long radii of curvature X-ray, concentrating solar, and other photonics mirrors is now being offered.
The tool, in the standard configuration, targets measurement of the 3D topography, and radii of curvature of X ray and optics having radii of curvature in excess of 100 m, however samples of smaller radii of curvature can be also measured. Tool is accepting samples as small as a few mm, and as big as 200 mm. Tool can also measure samples having irregular shapes.
"The same tool can be also used to measure full the topography and stress tensor in semiconductor wafers. The RMS roughness metrology is also offered as an option," said R&D Manager at Sunrise Optical LLC Dr. Walecki. Tool is available for product demonstration at SOLLC headquarters in Sunrise FL.
Product Availability: Sample measurement service is available now (please contact firstname.lastname@example.org for details). Lead-time for the tool in the basic configuration is currently 1 to 3 weeks ARO.
About Sunrise Optical LLCSunrise Optical LLC is an optical metrology company located in Sunrise FL. It specializes in manufacturing of spectroscopic, and imaging systems for three-dimensional image acquisition and development of new algorithms for three-dimensional image processing. Sunrise Optical LLC is serving the solar cell manufacturing and thin film metrology markets. More information on Sunrise Optical LLC can be found on the company website http://www.zebraoptical.com.