ZebraOptical OptoProfiler for Bow, Warp, Roller Wave Glass, and Edge Kink Metrology for Tempered Glass, Thin Film Solar Cells, and Other Devices

Sunrise, FL, January 06, 2010 --(PR.com)-- Sunrise Optical LLC has added a new Glass Option to Zebra OptoProfiler product family for thin film solar cell manufacturing.

Zebra OptoProfiler Glass Metrology Tool is capable of measuring topography of large sheets of coated and uncoated glass sheets. The Data collected by Zebra OptoProfiler can be exported in raw point cloud format for display and analysis using popular third party stress and design packages.

Same technology in scaled down version is offered for glass MEMs substrates on standard hardware Zebraoptical Optoprofiler P-1 and P-2E platforms. Product Features

- Measures glass substrates 0.5 m x 1.5 m and larger (scalable technology)

- Measures glass coated by most common AR, and conductive oxides coatings- The same system is offered with optional with spatially resolved quantum efficiency option for thin film solar cells

- Scaled down systems metrology for 1'', 2'', 3'', 5', and 8'' glass substrates for MEMs applications Product AvailabilitySample measurement service is now available.

Lead-time for tool in the basic configuration is currently 4 to 8 weeks ARO.

About Sunrise Optical LLC
Sunrise Optical LLC is an optical metrology company located in Sunrise FL. It specializes in design and manufacturing of spectroscopic and imaging systems for three-dimensional (3D) image acquisition and development of new algorithms for three-dimensional (3D) image processing. Sunrise Optical LLC is serving the solar cell manufacturing and thin film metrology markets. More information on Sunrise Optical LLC can be found on company website www.zebraoptical.com.

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