Copenhagen, Denmark, March 12, 2011 --(PR.com
)-- CAPRES A/S, a Danish developer of next generation semiconductor metrology systems for the direct nano- and micro-scale electrical characterization of materials, announced today a repeat order for its fully automated 300mm microRSP-A300 from an industry leading foundry located in Asia. With the development and production release of the microRSP-A300, CAPRES has addressed the challenges associated with in-line measurement on production wafers, thereby reducing reliance on data extrapolation and costly monitor wafers to validate doping levels.
Delivery and installation of the new order will occur in May 2011 and follows the successful evaluation of the first one delivered in 2010.
This production application of micro-scale sheet resistivity measurement allows, for the first time, immediate detection of process deviations thereby shortening the production control loop and enabling a commensurate reduction in work-in-process and losses due to out-of-specification production processes.
“A number of companies, including this customer, find that conventional Rs and optical metrology tools are not capable of measuring the sheet resistance of the very thin conductive films needed for production processes beyond the 40nm node,” said Bo Hansen, CEO of CAPRES A/S.
CAPRES A/S was established in 1999 and is a leading supplier of micro-scale metrology systems for the semiconductor and magnetic storage industries. The company has installed tools in Europe, Asia, and North America addressing a range of leading-edge metrology requirements. CAPRES metrology solutions utilize the company’s patented MEMS-based probe technology and are available in manual and fully automated configurations. CAPRES is backed by some of Scandinavia’s leading institutional investors include LD Pensions, Dansk Erhvervsinvestering, SEB Venture Capital, and CAT Invest.
More information? Visit www.capres.com
2800 Kgs. Lyngby, Denmark
Tel +45 88 82 14 70 Fax +45 88 82 14 99